B. O. Kolbesen

The detrimental influence of stacking faults on the refresh time of MOS memories

H. Strack, K. R. Mayer, B. O. Kolbesen, 1979 .

Analysis of the carrier and temperature distributions in gate turn-off thyristors by internal laser deflection

G. Deboy, Hans-Joachim Schulze, B. Simmnacher, 1997, Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's.

Floating zone growth of silicon single crystals in a double-ellipsoid mirror furnace

A. Eyer, A. Eyer, R. Nitsche, 1982 .