W. Chen

Lateral profiling of oxide charge and interface traps near MOSFET junctions

W. Chen, A. Balasinski, Tso-Ping Ma, 1993 .

Oxide charge buildup and spread-out during channel-hot-carrier injection in NMOSFETs

W. Chen, T.-P. Ma, 1992, IEEE Electron Device Letters.

Lateral distribution of radiation-induced damage in MOSFETs

A. Balasinski, W. Chen, T. P. Ma, 1991 .

Hot-carrier effects on interface-trap capture cross sections in MOSFETs as studied by charge pumping

A. Balasinski, W. Chen, T.-P. Ma, 1992, IEEE Electron Device Letters.

A new technique for measuring lateral distribution of oxide charge and interface traps near MOSFET junctions

W. Chen, T.-P. Ma, 1991, IEEE Electron Device Letters.