Tod V. Laurvick

Experimental validation of external load effects on micro-contact performance and reliability

Ronald A. Coutu, Tod V. Laurvick, 2015, 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm).

Improvements To Micro Contact Performance And Reliability

Tod V. Laurvick, 2016 .

Microelectromechanical (MEMS) optical beam control

Ronald A. Coutu, LaVern A. Starman, Tod V. Laurvick, 2009, Optical Engineering + Applications.

Contact resistance evaluation of micro-contacts with upper hemisphere and lower planar or engineered surfaces

Tod V. Laurvick, R. Coutu, C. Stilson, 2014, 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm).

Passive and active sensing — Plasmonic grating geometries and wavelength-dependent focus depth in IR detectors

Tod V. Laurvick, Patrick R. Kennedy, 2017, 2017 IEEE National Aerospace and Electronics Conference (NAECON).

Predicting total secondary electron emission from porous surfaces using a 3D pore geometry

Tod V. Laurvick, Kullen W. Waggoner, J. Sattler, 2017, 2017 IEEE National Aerospace and Electronics Conference (NAECON).

Modeling Micro-Porous Surfaces for Secondary Electron Emission Control to Suppress Multipactor

Tod V. Laurvick, R. Coutu, S. Fairchild, 2017 .

Experimental investigation of thin film spreading resistance in micro-contacts

Tod V. Laurvick, R. Coutu, C. Stilson, 2014, 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm).

Improved terahertz modulation using germanium telluride (GeTe) chalcogenide thin films

Tod V. Laurvick, C. Kodama, R. Coutu, 2015 .

Mechanical logic using MEMS

Ronald A. Coutu, Tod V. Laurvick, Christopher Kodama, 2015, 2015 National Aerospace and Electronics Conference (NAECON).

Improved grayscale lithography

Ronald A. Coutu, Tod V. Laurvick, Tod Laurvick, 2016, 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS).