W Wan

A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.

A Berghaus, A. Berghaus, J. Hannon, 2010, Ultramicroscopy.

A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.

A Berghaus, A. Berghaus, J. Hannon, 2013, Ultramicroscopy.