C. Y. Kim

Process to Form V-Grooved Trenches on Patterned Si (001) Substrates Using In Situ Selective Area Etching in a MOCVD Reactor

Daehyun Kim, D. Ko, W. Park, 2016 .

Effect of oxygen incorporation in a-plane GaN on p-type ohmic contact property

J. Ha, Hyojung Bae, Jaehyoung Park, 2014 .

Structural evolution and the control of defects in atomic layer deposited HfO2-Al2O3 stacked films on GaAs.

Hyoungsub Kim, K. Chung, Y. Kang, 2013, ACS applied materials & interfaces.

Uncertainty compensation methods for quantitative hardness measurement of materials using atomic force microscope nanoindentation technique

M. Joo, C. Y. Kim, Kyuho Park, 2013 .

Structural evolution and the control of defects in atomic layer deposited HfO2-Al2O3 stacked films on GaAs.

Hyoungsub Kim, K. Chung, Y. Kang, 2013, ACS applied materials & interfaces.