J. L. Ebel

Rationale for and Organization of the Engineering Information System Program

Anthony J. Gadient, J. L. Ebel, 1987, 24th ACM/IEEE Design Automation Conference.

The engineering information system program

J. L. Ebel, 1988, Digest of Papers. COMPCON Spring 88 Thirty-Third IEEE Computer Society International Conference.

Microcavity interferometry for MEMS device characterization

William S. Rabinovich, Todd H. Stievater, Harvey S. Newman, 2003 .

Thermal effects on the characteristics of AlGaAs/GaAs heterojunction bipolar transistors using two-dimensional numerical simulation

J. L. Ebel, L. L. Liou, C. Huang, 1993 .

Measurement of thermal-mechanical noise in microelectromechanical systems

William S. Rabinovich, Todd H. Stievater, Harvey S. Newman, 2002 .