G. Zwicker

Fabrication of 3.5 GHz surface acoustic wave filters by ion projection lithography

M. Kreutzer, G. Zwicker, M. Torkler, 1992 .

Thick polycrystalline silicon for surface-micromechanical applications: deposition, structuring and mechanical characterization

W. Riethmüller, B. Wenk, Joan Ramon Morante, 1996 .

The IC Ultra-Thin Back Surface - A Field of Real Nanoscale Fault Isolation Opportunities Requiring a Skillful Sample Preparation

C. Boit, M. DiBattista, F. Altmann, 2022, 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Electron beam induced current investigations of active electrical defects in silicon due to reactive ion etching and reactive ion beam etching processes

H. Habermeier, E. Bucher, G. Zwicker, 1994 .

Electron-beam-induced current and atomic force microscopy studies on silicon etch steps created by reactive ion etching and reactive ion beam etching

H. Habermeier, E. Bucher, G. Zwicker, 1994 .

Temperature dependent electron‐beam‐induced‐current investigation of electronic damages in silicon due to reactive ion etching

H. Habermeier, E. Bucher, G. Zwicker, 1994 .