Ta-Chuan Liao

发表

P‐27: Advanced Gate‐All‐Around Fin‐Like Poly‐Si TFTs with Multiple Nanowire Channels

Ya-Hsiang Tai, Wanjun Chen, Huang-Chung Cheng, 2008 .

Reliability improvement of InGaZnO thin film transistors encapsulated under nitrogen ambient

Chun-Yu Wu, Chih-Hung Tsai, Huang-Chung Cheng, 2012 .

High-Performance Solid-Phase Crystallized Polycrystalline Silicon Thin-Film Transistors with Floating-Channel Structure

T. Lei, Chia-wen Chang, C. Deng, 2008 .

Random Telegraph Noise Read Instability Characteristics in a Megabit RRAM Array

Yung-Huei Lee, Chih-Yang Chang, Wayne Wang, 2018, IEEE Electron Device Letters.

Novel junctionless silicon–oxide–nitride–oxide–silicon memory devices with field-enhanced poly-Si nanowire structure

Huang-Chung Cheng, I. Lee, Ta-Chuan Liao, 2015 .

Self-patterning of high-performance thin film transistors

Huang-Chung Cheng, Ta-Chuan Liao, Cheng-Chin Liu, 2009 .

Gate Bias Stresses of Gate-All-Around Poly-Si TFTs With Multiple Nanowire Channels

T. Kang, Ta-Chuan Liao, Chun-Kai Wang, 2012, IEEE Transactions on Electron Devices.

High-Performance Single-Crystal-Like Nanowire Poly-Si TFTs With Spacer Patterning Technique

Huang-Chung Cheng, T. Kang, Han-Wen Liu, 2011, IEEE Electron Device Letters.

Low Leakage Current Patterned Polymeric Transistors with PAG Assisted Cross-linking PVP as Gate Dielectric and Passivation Layers

Huang-Chung Cheng, Ta-Chuan Liao, Cheng-Chin Liu, 2008 .

Novel Gate-All-Around Poly-Si TFTs With Multiple Nanowire Channels

Shih-Wei Tu, Ta-Chuan Liao, Wei-Kai Lin, 2008, IEEE Electron Device Letters.

Novel Dielectric-Engineered Trapping-Charge Poly-Si-TFT Memory With a TiN–Alumina–Nitride–Vacuum–Silicon Structure

Ta-Chuan Liao, Chun-Yu Wu, Yen-Ting Liu, 2011, IEEE Electron Device Letters.

Effect of Nitrogen Plasma Treatment on Electrical Characteristics for Pd Nanocrystals in Nonvolatile Memory

Cheng-li Lin, T. Kang, Wen-Fa Wu, 2010 .

High Sensitivity of Dry-Type Nanowire Sensors With High- $k$ Dielectrics for pH Detection via Capillary Atomic Force Microscope Tip Coating Technique

You-Lin Wu, Po-Yen Hsu, Ta-Chuan Liao, 2012, IEEE Electron Device Letters.