C. Comber

Assessment of neutron- and proton-induced nuclear interaction and ionization models in Geant4 for Simulating single event effects

A. Chugg, B. Trousse, F. Lei, 2004, IEEE Transactions on Nuclear Science.

Investigation of single-ion multiple-bit upsets in memories on board a space experiment

D. McMorrow, S. Buchner, S. Kuboyama, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Comparative simulations of single event upsets induced by protons and neutrons in commercial srams

Fan Lei, C. Dyer, P. Truscott, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

Microdosimetry code simulation of charge-deposition spectra, single-event upsets and multiple-bit upsets

A. B. Campbell, S. Buchner, M. K. Oldfield, 1999 .

Investigation of single-ion multiple-bit upsets in memories on board a space experiment

A. B. Campbell, Dale McMorrow, S. Kuboyama, 1999 .