J. Walczak

Comparison of Modeling Approaches for the Capacitance–Voltage and Current–Voltage Characteristics of Advanced Gate Stacks

C. Busseret, E. Langer, C. Fiegna, 2007, IEEE Transactions on Electron Devices.

Semiconductor thickness effects in the double-gate SOI MOSFET

Bogdan Majkusiak, B. Majkusiak, J. Walczak, 1998 .