J.C. Tsang

Carbon Nanotube Electronics and Optoelectronics

A. Afzali, Y.-M. Lin, J. Appenzeller, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Full chip optical imaging of logic state evolution in CMOS circuits

J.A. Kash, J.C. Tsang, 1996, International Electron Devices Meeting. Technical Digest.

Dynamic internal testing of CMOS circuits using hot luminescence

J. Kash, J. Tsang, J.A. Kash, 1997, IEEE Electron Device Letters.

Temporal characterization of CMOS circuits by time resolved emission microscopy

J.A. Kash, J.C. Tsang, 1997, 1997 55th Annual Device Research Conference Digest.