Jens Schneider
发表
On the failure mechanism and current instabilities in RESURF type DeNMOS device under ESD conditions
Maryam Shojaei Baghini,
Harald Gossner,
Mayank Shrivastava,
2010,
2010 IEEE International Reliability Physics Symposium.
A new physical insight and 3D device modeling of STI type denmos device failure under ESD conditions
Maryam Shojaei Baghini,
Harald Gossner,
Mayank Shrivastava,
2009,
2009 IEEE International Reliability Physics Symposium.