Naim Moumen

Multi receiver concentrator photovoltaic testing at extreme concentrations

Hussam Khonkar, Supratik Guha, Brent Wacaser, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.

In situ infrared spectroscopy of hafnium oxide growth on hydrogen-terminated silicon surfaces by atomic layer deposition

Yunzhi Wang, M.-T. Ho, Yves J. Chabal, 2005 .

Experimental study of etched back thermal oxide for optimization of the Si/high-k interface

Howard R. Huff, Byoung Hun Lee, Gennadi Bersuker, 2004 .

Ammonia pretreatment for high-κ dielectric growth on silicon

M.-T. Ho, Dmitri Starodub, Lyudmila V. Goncharova, 2004 .

Exploring the limits of concentration for UHCPV

Hussam Khonkar, Alhassan Badahdah, Yves Martin, 2011, 2011 37th IEEE Photovoltaic Specialists Conference.

Concentrator photovoltaic reliability testing at extreme concentrations up to 2000 suns

Hussam Khonkar, Supratik Guha, Theodore van Kessel, 2009, 2009 34th IEEE Photovoltaic Specialists Conference (PVSC).

Integration of dual metal gate CMOS on high-k dielectrics utilizing a metal wet etch process

Husam N. Alshareef, Byoung Hun Lee, Muhammad M. Hussain, 2005 .