A. Watson

The effect of deep trench and sub-collector on the latchup robustness in BiCMOS silicon germanium technology

A. Watson, S.H. Voldman, 2004, Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting.

The influence of deep trench and substrate resistance on the latchup robustness in a BiCMOS silicon germanium technology

A. Watson, S.H. Voldman, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.