Tackhwi Lee
发表
Changhwan Choi,
Chang Yong Kang,
Se Jong Rhee,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
Optimization and reliability characteristics of TiO/sub 2//HfO/sub 2/ multi-metal dielectric MOSFETs
Chang Yong Kang,
Se Jong Rhee,
Manhong Zhang,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
Tackhwi Lee,
Byung-Gook Park,
Jong-Ho Lee,
2018,
2018 IEEE Symposium on VLSI Technology.