Th. Hackbarth

A closed UHV focused ion beam patterning and MBE regrowth technique

Johann Peter Reithmaier, Alfred Forchel, H. Brugger, 1995 .

High performance 100 nm T-gate strained Si/Si0.6Ge0.4 n-MODFET

Paul Crozat, R. Adde, Frédéric Aniel, 2003 .