Kuan-Chang Huang

Investigation of thermal stability and reliability of HfO2 based resistive random access memory devices with cross-bar structure

Umesh Chand, Tseung-Yuen Tseng, Chen-Hsi Lin, 2015 .

Enhanced Current Drive of Double-Gate $\alpha$ -IGZO Thin-Film Transistors

C. W. Liu, C. Liu, C. Chou, 2013, IEEE Electron Device Letters.

Mechanism of Nonlinear Switching in HfO2-Based Crossbar RRAM With Inserting Large Bandgap Tunneling Barrier Layer

Umesh Chand, Tseung-Yuen Tseng, T. Tseng, 2015, IEEE Transactions on Electron Devices.