A. Salman
发表
Akram A. Salman,
Jung-Hoon Chun,
Robert W. Dutton,
2011,
Microelectron. Reliab..
D. Ioannou,
M. Emam,
M. Pelella,
2006,
2006 International Electron Devices Meeting.
R. Dutton,
J. Chun,
M. Pelella,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
R. Dutton,
J. Chun,
M. Pelella,
2010,
2010 IEEE International SOI Conference (SOI).
Z. Chbili,
Qiliang Li,
D. Ioannou,
2013,
2013 IEEE International Conference of Electron Devices and Solid-state Circuits.
D. Ioannou,
A.A. Salman,
S.G. Beebe,
2007,
2007 International Semiconductor Device Research Symposium.
G. Gilfeather,
M. Pelella,
G. Gilfeather,
2005,
2005 Electrical Overstress/Electrostatic Discharge Symposium.
C. Putnam,
E. Rosenbaum,
R. Gauthier,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
N. Subba,
M. Pelella,
N. Subba,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
G. Boselli,
Zhong Chen,
A. Salman,
2015,
2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Akram A. Salman,
Qiliang Li,
Yang Yang,
2013,
IEEE Electron Device Letters.
Gianluca Boselli,
Mayank Shrivastava,
Nagothu Karmel Kranthi,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Akram A. Salman,
Robert W. Dutton,
Mario M. Pelella,
2009,
2009 IEEE International Reliability Physics Symposium.