D. Trémouilles

发表

G. Meneghesso, E. Simoen, C. Claeys, 2010, IEEE Transactions on Device and Materials Reliability.

Philippe Roussel, Steven Thijs, Guido Groeseneken, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

P. Hubík, V. Mortet, D. Machon, 2018, Diamond and Related Materials.

Philippe Godignon, Dominique Tournier, Karine Isoird, 2015, Microelectron. Reliab..

M. Bafleur, D. Tremouilles, Yuan Gao, 2008, 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

R. Plana, N. Nolhier, F. Coccetti, 2010, 2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF).

Natarajan Mahadeva Iyer, Mirko Scholz, Dimitri Linten, 2006 .

F. Richardeau, D. Trémouilles, F. Boige, 2019, IEEE Electron Device Letters.

R. Plana, N. Nolhier, F. Coccetti, 2009, 2009 European Microwave Integrated Circuits Conference (EuMIC).

L. Kavan, P. Hubík, V. Mortet, 2017 .

Natarajan Mahadeva Iyer, Dimitri Linten, Steven Thijs, 2005 .

F. Richardeau, N. Mauran, D. Trémouilles, 2023, Microelectronics Reliability.

David Trémouilles, Marise Bafleur, Houssam Arbess, 2015, Microelectron. Reliab..

Stéphane Lefebvre, Frédéric Richardeau, F. Boige, 2017, Microelectron. Reliab..

David Trémouilles, Marise Bafleur, Mouna Mahane, 2017, Microelectron. Reliab..

R. Rooyackers, C. Duvvury, N. Collaert, 2008, IEEE Transactions on Electron Devices.