M. Cohen

Radiation effects on active pixel sensors

J. David, M. Cohen, J.P. David, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Fully Optimized Cu based process with dedicated cavity etch for 1.75μm and 1.45μm pixel pitch CMOS Image Sensors

J. Vaillant, C. Cowache, Y. Cazaux, 2006, 2006 International Electron Devices Meeting.

Effects of Silicon Nitride Passivation Layer on Mean Dark Current and Quantum Efficiency of CMOS Active Pixel Sensors

Pierre Morin, Daniel Benoit, Jorge Regolini, 2005 .