Siping Zhao

Lattice disorder produced in GaN by He-ion implantation

Zhiguang Wang, Yabin Zhu, Jianrong Sun, 2017 .

EELS chemical bond characterization of process induced damages in low-k dielectric films

Juan Boon Tan, A. Du, Siping Zhao, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

H-ion Irradiation-induced Annealing in He-ion Implanted 4H-SiC

Zhi Ma, Zhiguang Wang, Yabin Zhu, 2017 .

Plane-view Transmission Electron Microscopy for Advanced Integrated Circuit

Siping Zhao, K. Li, E. Eddie, 2006, 2006 IEEE International Conference on Semiconductor Electronics.