A. Bozanic

Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies

Bongsoo Kim, Q. Gao, C. Crotti, 2009 .

Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies

Q. Gao, C. Crotti, M. Petravić, 2008 .

Direct observation of defect levels in hexagonal BN by soft X-ray absorption spectroscopy

Y. Chen, M. Petravić, A. Bozanic, 2009 .

Formation of defects in boron nitride by low energy ion bombardment

Y. Chen, R. Peter, M. Petravić, 2009 .

NEXAFS and XPS study of GaN formation on ion-bombarded GaAs surfaces

Bongsoo Kim, K. Kim, M. Petravić, 2009 .

Interaction of low-energy nitrogen ions with GaAs surfaces

Bongsoo Kim, M. Petravić, A. Bozanic, 2008 .