J. Thiesen

Electrooptic Inspection of Vector Leakage in Radiofrequency Multichip Modules

E. M. Russick, K.M. Brakora, K. Peterson, 2012, IEEE Transactions on Electromagnetic Compatibility.

Explanation of the limiting thickness observed in low-temperature silicon epitaxy

R. Crandall, H. Branz, J. Thiesen, 2000 .

Growth of epitaxial silicon at low temperatures using hot-wire chemical vapor deposition

R. Crandall, Kim M. Jones, A. Mahan, 1999 .

The Effect of H 2 Dilution On Thin Film SiN Deposited by Hot Wire Cvd Using SiH 4 and NH 3 Gas Mixtures

A. Dillon, D. L. Williamson, J. Perkins, 2001 .

The Growth of Homo-Epitaxial Silicon at Low Temperatures Using Hot Wire Chemical Vapor Deposition

R. Reedy, R. Crandall, Kim M. Jones, 1999 .

Preliminary Experiences with the Rexon UL-320-FDR: An Automated Thermoluminescent Dosimeter Reader with Removable Contact Heating Planchets and an Infrared Temperature Feedback System.

Long Kiu Chung, K. Kearfott, J. Thiesen, 2021, Health physics.