Lubomyr M. Zobniw

Multi-defect real time diagnosis using a single pin probe

Lubomyr M. Zobniw, 1976, DAC '76.

Designing the VLSI Device-to-Board Test Ukraine Translator

Lubomyr M. Zobniw, 1983, ITC.

Selective Controllability: A Proposal for Testing and Diagnosis

Lubomyr M. Zobniw, Peter Solecky, Frank C. Hsu, 1978, 15th Design Automation Conference.

Real time diagnosis using single pin probe

Lubomyr M. Zobniw, 1975, DAC '75.

Real time diagnosis of logic assemblies

Lubomyr M. Zobniw, F. David Patch, 1970, DAC '70.