Chaowen Yu

A partitioning technique for identification of error-capturing scan cells in scan-BIST

Irith Pomeranz, Sudhakar M. Reddy, Chaowen Yu, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

On test generation and fault diagnosis in scan built-in self-test

Chaowen Yu, Sudhakar M. Reddy, 2006 .

Weighted pseudo-random BIST for n-detection of single stuck-at faults

Irith Pomeranz, Sudhakar M. Reddy, Chaowen Yu, 2004, 13th Asian Test Symposium.

A scan BIST generation method using a markov source and partial bit-fixing

Irith Pomeranz, Sudhakar M. Reddy, Wei Li, 2003, DAC '03.

Circuit Independent Weighted Pseudo-Random BIST Pattern Generator

Irith Pomeranz, Sudhakar M. Reddy, Chaowen Yu, 2005, 14th Asian Test Symposium (ATS'05).