A. J. Wallash

Electrostatic discharge testing of tunneling magnetoresistive (TMR) devices

Manish Sharma, Shan X. Wang, A. Wallash, 2000 .

Magnetic changes in GMR heads caused by electrostatic discharge

A. Wallash, Y. K. Kim, A. J. Wallash, 1998 .

Electrostatic modeling and ESD damage of magnetoresistive sensors

A. J. Wallash, 1996 .

Degradation of GMR and TMR recording heads using very short duration ESD transients

L. Baril, A. Wallash, L. Baril, 2002 .