A. N. Ramamurthi

Direct observation of a critical length effect in dual-damascene Cu/oxide interconnects

Paul S. Ho, Ennis T. Ogawa, Mark R. Breen, 2001 .

Direct observation of a critical length effect in dual-damascene Cu interconnects

Paul S. Ho, Ennis T. Ogawa, Ki-Don Lee, 2000 .

Statistics of electromigration early failures in Cu/oxide dual-damascene interconnects

Paul S. Ho, Ennis T. Ogawa, Ki-Don Lee, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).

Electromigration Reliability of Dual-Damascene Cu/Oxide Interconnects

Paul S. Ho, Ennis T. Ogawa, Ki-Don Lee, 2000 .