N. Oda
发表
T. Takeuchi,
M. Tada,
Y. Hayashi,
2007,
IEEE Transactions on Electron Devices.
Noriaki Oda,
K. Noguchi,
K. Noguchi,
2000,
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
S. Saito,
H. Aoyama,
I. Mori,
2011
.
T. Kikkawa,
K. Mikagi,
T. Kikkawa,
1996,
International Electron Devices Meeting. Technical Digest.
S. Saito,
K. Sugai,
K. Ueno,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
S. Saito,
N. Oda,
S. Chikaki,
2010
.
S. Saito,
H. Aoyama,
I. Mori,
2011
.
K. Ueno,
N. Oda,
M. Suzuki,
2007
.
Y. Hayashi,
M. Sekine,
F. Ito,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
S. Saito,
S. Kondo,
N. Oda,
2010
.
S. Ogawa,
N. Oda,
E. Soda,
2011
.
K. Ueno,
Y. Kakuhara,
N. Oda,
2008
.
S. Saito,
N. Oda,
S. Chikaki,
2010,
IEEE Transactions on Electron Devices.
T. Usami,
M. Sekine,
K. Ueno,
2006,
2006 International Interconnect Technology Conference.