Jean-Louis Hodeau

Polarization fatigue in PbZr0.45Ti0.55O3-based capacitors studied from high resolution synchrotron x-ray diffraction

Ivan Baturin, V. Shur, J. Hodeau, 2005 .

A portable instrument for in situ determination of the chemical and phase compositions of cultural heritage objects

Philippe Walter, Pierre Bordet, Joseph Salomon, 2008 .

Probing the structure of heterogeneous diluted materials by diffraction tomography

Pierre Bleuet, Jean Susini, Philippe Walter, 2008 .

Neutron and Synchrotron Radiation for Condensed Matter Studies

José Baruchel, C. Schlenker, J. Baruchel, 1994 .