L. Palmqvist

Electrical properties of field grading materials influenced by the silicon carbide grain size

U. Gafvert, U. Gafvert, E. Mårtensson, 2001, ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117).

Electrical properties of field grading materials with silicon carbide and carbon black

U. Gafvert, E. Mårtensson, L. Palmqvist, 1998, ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132).

High-frequency impacts in a converter-based back-to-back tie; the Eagle Pass installation

S. Halen, A. Edris, D. Kidd, 2003 .