B. Reuscher
发表
Eberhard Kerscher,
P. Grad,
Michael Kopnarski,
2012
.
B. Hillebrands,
P. Candeloro,
A. Brodyanski,
2007
.
B. Hillebrands,
R. Stamps,
A. Brodyanski,
2008
.
B. Reuscher,
H. Gnaser,
Detlef Kramczynski,
2014
.
B. Reuscher,
H. Gnaser,
A. Zeuner,
2012
.
B. Hillebrands,
A. Brodyanski,
M. Kopnarski,
2011
.
B. Reuscher,
H. Gnaser,
M. Wahl,
2013
.
Atom probe tomography of ion-irradiated ultra-thin Fe/Cr/Fe trilayers with sub-nm spatial resolution
M. Kopnarski,
B. Hillebrands,
R. Neb,
2012
.
C. Felser,
B. Hillebrands,
G. Jakob,
2006,
cond-mat/0609633.
Focused ion beam implantation of Ga in Si and Ge: fluence‐dependent retention and surface morphology
A. Brodyanski,
B. Reuscher,
H. Gnaser,
2008
.
B. Hillebrands,
S. Pofahl,
P. Pirro,
2012
.
B. Hillebrands,
P. Candeloro,
A. Brodyanski,
2006
.
B. Hillebrands,
A. Brodyanski,
M. Kopnarski,
2005
.
A. Brodyanski,
B. Reuscher,
H. Gnaser,
2008
.