Joseph B. Bernstein
发表
Joseph B. Bernstein,
Thomas M. Ventura,
A. i. Radomski,
1994
.
Joseph B. Bernstein,
J. Bernstein,
2014
.
Bin Wang,
Eric M. Vogel,
John S. Suehle,
2001,
2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580).
Joseph B. Bernstein,
L. Yang,
J. Bernstein,
2002
.
Joseph B. Bernstein,
Avshalom Hava,
Jin Qin,
2011
.
Joseph B. Bernstein,
Gady Golan,
Moshe Azoulay,
2018,
2018 IEEE International Conference on the Science of Electrical Engineering in Israel (ICSEE).
Liyu Yang,
Joseph B. Bernstein,
Bin Qian,
2011
.
Joseph B. Bernstein,
Liyu Yang,
2012
.
Joseph B. Bernstein,
B. D. Colella,
1995
.
Joseph B. Bernstein,
Thomas M. Ventura,
Aaron T. Radomski,
1994,
Advanced Lithography.
Joseph B. Bernstein,
K. Chung,
Liyu Yang,
2001
.
Joseph B. Bernstein,
Kuan-Jung Chung,
2010
.
Joseph B. Bernstein,
Liyu Yang,
Kuan-Jung Chung,
2003
.
Joseph B. Bernstein,
Emmanuel Bender,
2021,
Sensors.
Bin Wang,
Eric M. Vogel,
John S. Suehle,
2000,
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
John F. Conley,
Bin Wang,
Eric M. Vogel,
2001
.
Bin Wang,
Eric M. Vogel,
John S. Suehle,
2000
.
Eric M. Vogel,
Joseph B. Bernstein,
Dawei Heh,
2003
.
Joseph B. Bernstein,
Chathan M. Cooke,
C. Cooke,
1991
.
Gennadi Bersuker,
Eric M. Vogel,
Alain C. Diebold,
2006
.
Prasad Chaparala,
John S. Suehle,
Joseph B. Bernstein,
1998,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).
Joseph B. Bernstein,
J. Bernstein,
1992
.
Bin Wang,
John F. Conley,
Eric M. Vogel,
2002
.
Joseph B. Bernstein,
Liyu Yang,
Carl K. King,
2003
.
The effect of stress interruption and pulsed biased stress on ultra-thin gate dielectric reliability
Bin Wang,
Eric M. Vogel,
John S. Suehle,
2000,
2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515).
Wei Zhang,
Joseph B. Bernstein,
C. H. Nicholas,
1998
.
Joseph B. Bernstein,
Peter W. Wyatt,
S. S. Cohen,
1992
.
Joseph B. Bernstein,
Joohan Lee,
Gang Yang,
2000
.
John S. Suehle,
Joseph B. Bernstein,
J. Bernstein,
2002,
IEEE International Integrated Reliability Workshop Final Report, 2002..
Joseph B. Bernstein,
Kuan-Jung Chung,
Ji Luo,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
Eric M. Vogel,
Joseph B. Bernstein,
Dawei Heh,
2002,
IEEE International Integrated Reliability Workshop Final Report, 2002..