J. Colvin

Effects of substrate resistances on LNA performance and a bondpad structure for reducing the effects in a silicon bipolar technology

J. Colvin, S. S. Bhatia, J. T. Colvin, 1999 .

A NEW TECHNIQUE TO RAPIDLY IDENTIFY LOW LEVEL GATE OXIDE LEAKAGE IN FIELD EFFECT SEMICONDUCTORS USING A SCANNING ELECTRON MICROSCOPE.

J. Colvin, 1990 .

Backside Preparation and Optics

J. Colvin, Christopher J. Colvin, 2019, Microelectronics Failure Analysis.

A bond-pad structure for reducing effects of substrate resistance on LNA performance in a silicon bipolar technology

K.K. O, J.T. Colvin, S.S. Bhatia, 1998, Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.98CH36198).

ESD FAILURE ANALYSIS METHODOLOGY

Jim Colvin, J. Colvin, 1998 .