J. Hale

发表

Prospects for IR emissivity control using electrochromic structures 1 Presentented at the ICMCTF 97

John A. Woollam, J. Woollam, J. Hale, 1999 .

Dielectric function representation by B‐splines

Blaine D. Johs, B. Johs, J. Hale, 2008 .

Low Earth Orbit Effects on Indium Tin Oxide and Polyester and Comparison With Laboratory Simulations

R. Synowicki, J. Woollam, N. Ianno, 1993 .

Real time in situ composition control of InGaAs lattice matched to InP by an 88-wavelength ellipsometer

Yong-Hang Zhang, B. Johs, Yong-Hang Zhang, 1998 .

Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations

R. Collins, S. Marsillac, B. Johs, 2012, 2012 38th IEEE Photovoltaic Specialists Conference.

All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region

M. Schubert, J. Woollam, J. Hale, 2000 .

Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment

R. Synowicki, J. Woollam, A. Moore, 1994 .

Atomic oxygen effects on thin film space coatings studied by spectroscopic ellipsometry, atomic force microscopy, and laser light scattering

R. Synowicki, J. Woollam, J. Hale, 1992 .

Carbon overcoats with controlled properties: non-destructive ellipsometry evaluation

Tim Makovicka, William A. McGahan, J. Hale, 1993 .

Infrared switching electrochromic devices based on tungsten oxide

Mathias Schubert, John A. Woollam, E. Franke, 2000 .

Spectroscopic ellipsometry characterization of multilayer optical coatings

James N. Hilfiker, Ron A. Synowicki, Greg K. Pribil, 2018, Surface and Coatings Technology.

Recent developments in spectroscopic ellipsometry for in-situ applications

Craig M. Herzinger, John A. Woollam, Jeff Hale, 2001, SPIE Optics + Photonics.

In situ and Ex situ Applications of Spectroscopic Ellipsometry

P. G. Snyder, J. Woollam, H. Yao, 1993 .

Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films

R. Synowicki, S. Nafis, J. Woollam, 1997 .

Oxygen plasma asher contamination: An analysis of sources and remedies

R. Synowicki, J. Woollam, N. Ianno, 1996 .

In-situ ellipsometric characterization of the electrodeposition of metal films

J. Woollam, D. Thompson, J. Hilfiker, 1995 .

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

P. Miller, M. Stadermann, J. Hilfiker, 2017 .

OPTICAL CONSTANTS OF CRYSTALLINE WO3 DEPOSITED BY MAGNETRON SPUTTERING

J. Woollam, D. Thompson, T. Tiwald, 1999 .

Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis

Andrew C. Martin, J. Hilfiker, T. Tiwald, 2020 .

Low-Earth-Orbit Exposure of Carbon-Based Materials Aboard Shuttle Flight STS-46

R. Synowicki, J. Woollam, A. Moore, 1995 .

Thin film materials exposure to low Earth orbit aboard Space Shuttle

R. Synowicki, S. Nafis, J. Woollam, 1995 .

Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

John A. Woollam, Michael J. DeVries, J. Woollam, 1998 .

Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide

John A. Woollam, Daniel W. Thompson, Thomas E. Tiwald, 1999 .

Reversible optical structuring of polymer waveguides doped with photochromic molecules

Germano Montemezzani, Peter Günter, F. Diederich, 2000 .

Real-time Monitoring of semiconductor growth by Spectroscopic ellipsometry

J. A. Roth, I. Ferguson, B. Johs, 1997 .