Alastair A. MacDowell

发表

Development of a laboratory extreme-ultraviolet lithography tool

Richard H. Stulen, Weng W. Chow, Michael E. Malinowski, 1994, Advanced Lithography.

Nickel-plated invar mirrors for synchrotron radiation beam lines

Malcolm R. Howells, Roger A. Paquin, Alastair A. MacDowell, 2002, SPIE Optics + Photonics.

Developments in synchrotron x-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Singanallur Venkatakrishnan, Francesco Panerai, Nagi N. Mansour, 2016, Optical Engineering + Applications.

Cross-check of different techniques for two-dimensional power spectral density measurements of x-ray optics

Valeriy V. Yashchuk, Farhad Salmassi, Eric M. Gullikson, 2005, SPIE Optics + Photonics.

Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Howard A. Padmore, Malcolm R. Howells, Scott C. Locklin, 1997, Optics & Photonics.

2008 ALS Users' Meeting and Workshops

Alastair A. MacDowell, Julie McCullough, Alexei V. Fedorov, 2009 .

Soft x-ray (14 nm) lithography with ultrathin imaging layers and selective electroless metallization

Franco Cerrina, Obert R. Wood, Charles S. Dulcey, 1993, Advanced Lithography.

The Tomography Round-Robin datasets

Francesco De Carlo, Marco Stampanoni, Federica Marone, 2016 .

Application of laser plasma sources in soft x-ray projection lithography

Richard H. Stulen, Weng W. Chow, Michael E. Malinowski, 1994, Optics & Photonics.

High performance data management and analysis for tomography

Lavanya Ramakrishnan, Brian Tierney, Alexander Hexemer, 2014, Optics & Photonics - Optical Engineering + Applications.

Flat-field calibration of CCD detector for long trace profiler

Gregory Y. Morrison, Valeriy V. Yashchuk, Wayne R. McKinney, 2007, SPIE Optical Engineering + Applications.

20:1 projection soft x-ray lithography using trilevel resist

Richard R. Freeman, Obert R. Wood, David L. Windt, 1990, Advanced Lithography.

Elimination of 'ghost'-effect-related systematic errors in metrology of x-ray optics with a long trace profiler

Valeriy V. Yashchuk, Alastair A. MacDowell, Steve C. Irick, 2005, SPIE Optical Metrology.

Two-dimensional power spectral density measurements of x-ray optics with the Micromap interferometric microscope

Valeriy V. Yashchuk, Wayne R. McKinney, Malcolm R. Howells, 2005, SPIE Optical Metrology.

Coded aperture imaging for fluorescent x-rays

Alastair A. MacDowell, Stefano Marchesini, Abdel Haboub, 2012, Other Conferences.

Thermal and mechanical joints to cryo-cooled silicon monochromator crystals

Gregory Y. Morrison, Alastair A. MacDowell, Sirine C. Fakra, 2006, SPIE Optics + Photonics.

Preliminary design of a set of four beamlines for the DLSR upgrade of the advanced light source

Valeriy V. Yashchuk, Kenneth A. Goldberg, Antoine Wojdyla, 2020 .

Making Advanced Scientific Algorithms and Big Scientific Data Management More Accessible

Eli Dart, Brian Tierney, Keith Beattie, 2016, Computational Imaging.

Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications

Howard A. Padmore, Alastair A. MacDowell, J. R. Patel, 1998, Optics & Photonics.

Extreme UV resist technology: the limits of silylated resist resolution

Avijit K. Ray-Chaudhuri, Daniel A. Tichenor, Bruno LaFontaine, 1995, Advanced Lithography.

Machine learning for micro-tomography

Talita Perciano, Harinarayan Krishnan, Daniela Ushizima, 2017, Optical Engineering + Applications.

Design, analysis, and performance of an epoxy-bonded bendable mirror

Howard A. Padmore, Steven C. Irick, Alastair A. MacDowell, 1998, Optics & Photonics.

Real-time data-intensive computing

Eli Dart, Brian Tierney, Keith Beattie, 2016 .

New procedures for the adjustment of elliptically bent mirrors with the long trace profiler

Valeriy V. Yashchuk, Wayne R. McKinney, Steven C. Irick, 2007, SPIE Optical Engineering + Applications.

Paper CCC FULL TEXT publish version

P. Fischer, Alastair A. MacDowell, Paulo J.M. Monteiro, 2012 .

A SAXS/WAXS/GISAXS Beamline with Multilayer Monochromator

Howard A. Padmore, Alexander Hexemer, Alastair A. MacDowell, 2010 .

Submicron X-ray diffraction and its applications to problems in materials and environmental science.

Howard A. Padmore, Alastair A. MacDowell, Richard Celestre, 2002 .

Damage evolution and failure mechanisms in additively manufactured stainless steel

Alastair A. MacDowell, Dilworth Y. Parkinson, A. MacDowell, 2016 .

The optics beamline at the Swiss Light Source

Howard A. Padmore, U. Flechsig, Alastair A. MacDowell, 2009 .

Sub-Micron White-Beam Focusing Using Elliptically Bent Mirrors

Howard A. Padmore, Malcolm R. Howells, Zahid Hussain, 1997 .

High temperature x-ray micro-tomography

Dong Liu, Francesco Panerai, Nagi N. Mansour, 2016 .

Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction

Alastair A. MacDowell, Richard Celestre, King-Ning Tu, 2003 .

Quantitative X-ray microtomography study of 3-D void growth induced by electromigration in eutectic SnPb flip-chip solder joints

Yi-Shao Lai, Alastair A. MacDowell, Dula Parkinson, 2011 .

A New Approach To Light-Weight Ablators Analysis: From Micro-Tomography Measurements to Statistical Analysis and Modeling

Francesco Panerai, Nagi N. Mansour, Alastair A. MacDowell, 2013 .

Optimal tuning and calibration of bendable mirrors with slope-measuring profilers

Valeriy V. Yashchuk, Wayne R. McKinney, Alastair A. MacDowell, 2009 .

In situ 3D monitoring of corrosion on carbon steel and ferritic stainless steel embedded in cement paste

Dubravka Bjegović, Alastair A. MacDowell, Paulo J.M. Monteiro, 2014 .

At-wavelength interferometry for extreme ultraviolet lithography

Kenneth A. Goldberg, Jeffrey Bokor, Sang Hun Lee, 1997 .