N. Tripathi

A 10nm platform technology for low power and high performance application featuring FINFET devices with multi workfunction gate stack on bulk and SOI

B. Lherron, D. Chanemougame, P. Oldiges, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

Comprehensive study of effective current variability and MOSFET parameter correlations in 14nm multi-fin SOI FINFETs

T. B. Hook, T. Yamashita, T. E. Standaert, 2013, 2013 IEEE International Electron Devices Meeting.

A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels

P. Oldiges, C. Park, N. Loubet, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

10nm FINFET technology for low power and high performance applications

D. Chanemougame, P. Oldiges, B. Haran, 2014, 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).