P. Peumans

Accurate model for time-dependent dielectric breakdown of high-k metal gate stacks

T. Nigam, A. Kerber, P. Peumans, 2009, 2009 IEEE International Reliability Physics Symposium.

High throughput cell sorter based on lensfree imaging of cells

R. Stahl, L. Lagae, G. Vanmeerbeeck, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

An Approach to Cost-Effective, Robust, Large-Area Electronics using Monolithic Silicon

Fu-Kuo Chang, G. Lanzara, C. Vancura, 2007, 2007 IEEE International Electron Devices Meeting.

Technology assessment for MRAM cells with magnet/semiconductor bits

G. Borghs, J. Das, J. De Boeck, 1999, IEEE International Magnetics Conference.