A. Pinato

Improved reliability of organic light-emitting diodes with indium-zinc-oxide anode contact

G. Meneghesso, M. Meneghini, A. Tazzoli, 2009, 2009 IEEE International Reliability Physics Symposium.

Light, bias, and temperature effects on organic TFTs

J. Genoe, K. Myny, G. Meneghesso, 2010, 2010 IEEE International Reliability Physics Symposium.

Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in $\hbox{NPD/Alq}_{3}$ OLEDs

G. Meneghesso, M. Meneghini, A. Tazzoli, 2010, IEEE Transactions on Electron Devices.