T. Ono

发表

N. Mise, K. Nojiri, T. Usui, 2000, 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479).

Keizo Suzuki, Andreas Jahnke, Susumu Hiraoka, 1991 .

M. Sato, N. Mise, S. Kamiyama, 2008, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.