E. Kofi Vida-Torku

Balancing structured and ad-hoc design for test: testing of the PowerPC 603 microprocessor

Craig Hunter, E. Kofi Vida-Torku, Johnny LeBlanc, 1994, Proceedings., International Test Conference.

Quality Level and Fault Coverage for Multichip Modules

Charles E. Radke, E. Kofi Vida-Torku, 1983, 20th Design Automation Conference Proceedings.

Designing for scan test of high performance embedded memories

E. Kofi Vida-Torku, George Joos, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Do Stuck Fault Models Reflect Manufacturing Defects?

C. C. Beh, Charles E. Radke, E. Kofi Vida-Torku, 1982, ITC.

Design and test of the PowerPC 603 microprocessor

E. Kofi Vida-Torku, Charles H. Malley, Sung Park, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

Impact Of Boundary-Scan Design On Delay Test

E. Kofi Vida-Torku, 1992, Proceedings International Test Conference 1992.

Petri Net Based Search Directing Heuristics for Test Generation

E. Kofi Vida-Torku, Beverly Messick Huey, 1983, 20th Design Automation Conference Proceedings.

Performance Assurance of Memories Embedded in VLSI Chips

Charles E. Radke, E. Kofi Vida-Torku, James A. Monzel, 1986, ITC.