T. Piotrowski

Thermal figure of merit M∗ limit for (CdHg)Te photoconductive detectors

J. Piotrowski, J. Piotrowski, T. Piotrowski, 1978 .

Ultimate detectivity of (CdHg)Te infrared photoconductors

J. Piotrowski, J. Piotrowski, T. Piotrowski, 1979 .

Characterization of oxygen impurity concentration in silicon based on thermal emission measurements

V. K. Malyutenko, T. Piotrowski, T. Piotrowski, 1996 .

Characterization of silicon wafer bonding by observation in transmitted infrared radiation from an extended source

W. Jung, T. Piotrowski, W. Jung, 2000 .