M V Zorina

Note: A stand on the basis of atomic force microscope to study substrates for imaging optics.

N. Salashchenko, N. Chkhalo, M. Zorina, 2015, The Review of scientific instruments.

Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics.

N. Chkhalo, A. Pestov, Y. Vainer, 2014, Optics express.

Short-period multilayer X-ray mirrors.

N I Chkhalo, N N Salashchenko, M V Zorina, 2003, Journal of synchrotron radiation.

Application of point diffraction interferometry for middle spatial frequency roughness detection.

M V Svechnikov, N I Chkhalo, M N Toropov, 2015, Optics letters.