A.M. Mohsen

Alpha particle induced charge collection measurements and the effectiveness of reflecting barriers on VLSI memories

Sai-Wai Fu, A.M. Mohsen, T.C. May, 1982, 1982 International Electron Devices Meeting.

Alpha-particle-induced charge collection measurements and the effectiveness of a novel p-well protection barrier on VLSI memories

A.M. Mohsen, T.C. May, Sai-Wai Fu, 1985, IEEE Transactions on Electron Devices.