X Aymerich

Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter.

M. Lanza, M. Porti, M. Nafría, 2008, The Review of scientific instruments.

Gate Voltage Influence on the Channel Hot-Carrier Degradation of High-$k$ -Based Devices

Esteve Amat, R. Degraeve, M. Nafría, 2011, IEEE Transactions on Device and Materials Reliability.

Recovery of the MOSFET and Circuit Functionality After the Dielectric Breakdown of Ultrathin High-$k$ Gate Stacks

X Aymerich, A Crespo-Yepes, J Martin-Martinez, 2010, IEEE Electron Device Letters.