J. Shin

Line edge roughness characterization using nanotubed-AFM and SEM

F. Cerrina, J. Shin, 2002, 2002 International Microprocesses and Nanotechnology Conference, 2002. Digest of Papers..

Very-low-threshold index-confined planar microcavity lasers

Q. Deng, D. Deppe, D. Huffaker, 1995, IEEE Photonics Technology Letters.

Depth dependence of resist line-edge roughness: Relation to photoacid diffusion length

Franco Cerrina, J. Shin, Y. Ma, 2002 .