W. Hänni
发表
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U. Staufer,
1999
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High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy
Christian Boit,
Alexander Olbrich,
B. Ebersberger,
1999
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G. Müller,
N. Pupeter,
Helmut Piel,
1996
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Trudo Clarysse,
Wilfried Vandervorst,
Louis Hellemans,
1998
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J. Burger,
P. Niedermann,
R. Christoph,
1996
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