C. Poivey

Radiation Characterization of Microsemi ProASIC3 Flash FPGA Family

C. Poivey, M. Grandjean, F. X. Guerre, 2010, 2011 IEEE Radiation Effects Data Workshop.

Radiation characterisation of commercially available 1 Mbit/4 Mbit SRAMs for space applications

R. Harboe-Sorensen, C. Poivey, M. Bruggemann, 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

Characterization of single hard errors (SHE) in 1 M-bit SRAMs from single ion

C. Poivey, J. Beaucour, T. R. Oldham, 1994 .

Radiation Characteristics of a 0.11 Micrometer Modified Commercial CMOS Process

C. Poivey, Kenneth A. LaBel, Anthony M. Phan, 2006 .

Current single event effects and radiation damage results for candidate spacecraft electronics

H.S. Kim, P.W. Marshall, C.M. Seidleck, 2002, IEEE Radiation Effects Data Workshop.

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

A. Lesea, C. Poivey, M. Berg, 2008, IEEE Transactions on Nuclear Science.