Dirch H Petersen

Accurate microfour-point probe sheet resistance measurements on small samples.

Sune Thorsteinsson, Torben Mikael Hansen, Ole Hansen, 2009, The Review of scientific instruments.

Atomic Layer Deposition of Ruthenium with TiN Interface for Sub-10 nm Advanced Interconnects beyond Copper.

Christopher J. Wilson, Philippe Roussel, Christoph Adelmann, 2016, ACS applied materials & interfaces.

Electrically continuous graphene from single crystal copper verified by terahertz conductance spectroscopy and micro four-point probe.

Peter Bøggild, Michael Hilke, Bjarke S. Jessen, 2014, Nano letters.