S. Aota

Observation of top quark production in $\bar{p}p$ collisions

A. Ribon, Stephen R. Leone, E. Meschi, 1995 .

A cost-conscious 32nm CMOS platform technology with advanced single exposure lithography and gate-first metal gate/high-k process

N. Matsunaga, K. Taniguchi, M. Inohara, 2008, 2008 IEEE International Electron Devices Meeting.

The CDF-II detector: Technical design report

A. Ribon, V. Pavlicek, William Trischuk, 1996 .

Measurement of [Formula presented] production correlations, [Formula presented] mixing, and a limit on [Formula presented] in [Formula presented] collisions at [Formula presented] TeV

A. Ribon, E. Meschi, A. Scribano, 1997 .

Measurement of Dijet Angular Distributions at CDF

A. Ribon, Stephen R. Leone, E. Meschi, 1996, hep-ex/9609011.

First observation of the all-hadronic decay of tt̄ pairs

A. Ribon, E. Meschi, A. Scribano, 1997 .

A 65nm low power CMOS platform with 0.495/spl mu/m/sup 2/ SRAM for digital processing and mobile applications

E. Morifuji, F. Matsuoka, S. Yamada, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..

Measurement of dijet angular distributions by the collider detector at fermilab

A. Ribon, E. Meschi, A. Scribano, 1996 .

A 1.5 V high performance mixed signal integration with indium channel for 130 nm technology node

T. Noguchi, Masakazu Kakumu, Eiji Morifuji, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

Evidence for W+W- production in (p)over-bar-p collisions at root s=1.8 TeV

A. Ribon, Stephen R. Leone, William Trischuk, 1997 .