Hui Zhu

Assessment of pulse conditions effects on reliability in GaN-based high electron mobility transistors by transient temperature measurements

Shiwei Feng, Yamin Zhang, Hui Zhu, 2013 .

The thermal properties of AlGaAs/GaAs laser diode bars analyzed by the transient thermal technique

Xiaoyu Ma, Shiwei Feng, Chunsheng Guo, 2013 .

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

Shiwei Feng, Guangchen Zhang, Chunsheng Guo, 2014, IEEE Electron Device Letters.

Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs

Shiwei Feng, Chunsheng Guo, Xueqin Gong, 2014, IEEE Transactions on Device and Materials Reliability.

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

Shiwei Feng, Yamin Zhang, Bangbing Shi, 2018, IEEE Transactions on Power Electronics.